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Effects of Humidity on Non-Hermetically Packaged III-V Structures and DevicesHigh humidity and temperature test (known as 85/85 tests) were performed on various III-V devices and structures to determine environmental effects in non-hermetically packaged GaAs membrane mixer diodes.
Document ID
20060040938
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Leon, R.
Martin, S.
Lee, T.
Okuno, J.
Ruiz, R.
Gauldin, R.
Gaidis, M.
Smith, R.
Date Acquired
August 23, 2013
Publication Date
October 26, 1999
Distribution Limits
Public
Copyright
Other
Keywords
oxidation 2.5 THz membrane diodes AlGaAs films 85/85

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