Multi-angle Imaging SpectroRadiometer (MISR): Optical Characterization of the Spectralon Calibration Panels

The reflectance properties of an engineering model of the Spectralon panel intended for use within an On-Board Calibrator (OBC) on the NASA Multi-angle Imaging SpectroRadiometer (MISR) instrument have been fully characterized with regard to panel uniformity and isotropy in response to three incident laser wavelengths of 442, 632.8 and 859.9 nm. A regional variation in bidirectional reflectance function (BRF) across the surface of the engineering model (EM) panel, contributing to spatial non-uniformity at the +/-2% level has been measured at all three laser wavelengths. Further, a BRF anisotropy has been identified. The mechanism causing these departures from the ideal Lambertian surface may originate in the sanding of the Spectralon surface in the final stage of preparation. This is corroborated by measurements made on a 'pressed' polytetrafluoroethylene (PTFE) panel in which a greatly reduced anisotropy in panel BRF is measured. The EM panel BRF reveals deviation from a Lambertian characteristic manifest as an off-specular peak in the forward scattering direction. A common cross-over point at an angle of reflection of around 37 at which the BRF is constant within 0.4% for an illumination angle range of ui = 30 60 is observed at all three wavelengths. Two Spectralon protoflight panels which were fabricated after the engineering model was studied were also the subject of a uniformity study over part of the area of the Spectralon panels at the 442 nm wavelength. The analysis indicated that the panel uniformity satisfies the 0.5% criterion indicating improved panel preparation. However, the off specular peak in the forward scattering direction is essentially unchanged with the cross-over point at approximately 37.