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Hot pixel generation in active pixel sensors: dosimetric and micro-dosimetric responseThe dosimetric response of an active pixel sensor is analyzed. heavy ions are seen to damage the pixel in much the same way as gamma radiation. The probability of a hot pixel is seen to exhibit behavior that is not typical with other microdose effects.
Document ID
20060043371
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Scheick, Leif
Novak, Frank
Date Acquired
August 23, 2013
Publication Date
September 1, 2003
Meeting Information
Meeting: RADESCS
Location: Noordwijk
Country: Netherlands
Start Date: September 15, 2003
End Date: September 19, 2003
Distribution Limits
Public
Copyright
Other
Keywords
single hard error
APS
hot pixel
dark current

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