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Radiation effects on microelectronics and future space missionsThis paper briefly reviews the three basic radiation effect mechanisms, and how they interrupt the functionality of currently available non-volatile memory technologies. This paper also presents a very general overview of the radiation environments expected in future space exploration missions. Unfortunately, these environments will be very harsh, from a radiation standpoint, and thus a significant effort is required to develop non-volatile technologies that will meet future mission requirements.
Document ID
20060043627
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Patterson, Jeffrey D.
Date Acquired
August 23, 2013
Publication Date
November 12, 2003
Meeting Information
Meeting: 2003 Non-volatile Memory Technology Symposium
Location: San Diego, CA
Country: United States
Start Date: April 12, 2003
End Date: April 13, 2003
Distribution Limits
Public
Copyright
Other
Keywords
radiation effects
nonvolatile technologies

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