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Preliminary low temperature electron irradiation of triple junction solar cellsJPL has routinely performed radiation testing on commercial solar cells and has also performed LILT testing to characterize cell performance under far sun operating conditions. This research activity was intended to combine the features of both capabilities to investigate the possibility of any room temperature annealing that might influence the measured radiation damage. Although it was not possible to maintain the test cells at a constant low temperature between irradiation and electrical measurements, it was possible to obtain measurements with the cell temperature kept well below room temperature.
Document ID
20060044198
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Stella, Paul M.
Mueller, Robert L.
Scrivner, Roy L.
Helizon, Roger S.
Date Acquired
August 23, 2013
Publication Date
September 20, 2005
Subject Category
Energy Production And Conversion
Meeting Information
Meeting: 19th Space Photovoltaic Research and Technology Conference
Location: Cleveland, OH
Country: United States
Start Date: September 20, 2005
End Date: September 22, 2005
Distribution Limits
Public
Copyright
Other
Keywords
annealing
low temperature radiation
photovoltaics

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