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Absolute optical metrology : nanometers to kilometersWe provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.
Document ID
20060044287
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Dubovitsky, Serge
Lay, O. P.
Peters, R. D.
Liebe, C. C.
Date Acquired
August 23, 2013
Publication Date
July 11, 2005
Meeting Information
Meeting: International Quantum Electronics Conference and Pacific Rim Conference on Lasers and Electro-Optics (IQEC/CLEO-PR 2005)
Location: Tokyo
Country: Japan
Start Date: July 11, 2005
End Date: July 15, 2005
Distribution Limits
Public
Copyright
Other
Keywords
optical metrology

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