NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Results of Single-event Effects Measurements Conducted by the Jet Propulsion LaboratoryThis paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Document ID
20060050293
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/39717
Authors
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Miyahira, Tetsuo F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2006
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: International Nuclear and Space Radiation Effects Conference
Location: Jacksonville, FL
Country: United States
Start Date: July 17, 2006
Distribution Limits
Public
Copyright
Other
Keywords
Cyclotron
Latchup
heavy ions
single-event effect (SEE)

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available