Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Rivas, Rosa M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Johnston, Allan H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Miyahira, Tetsuo F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Rax, Bernard G. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Wiedeman, Michael D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 23, 2013
Publication Date
June 20, 2004
Subject Category
Fluid Mechanics And Thermodynamics Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Atlanta, GA
Country: United States
Start Date: June 20, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
Enhanced Low Dose Rate Sensitivity (ELDRS)Complementary Metal Oxide Semiconductors (CMOS)BipolarHigh Dose Level (HDL)Low Dose Level (LDL)Total Ionizing Dose (TID)