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Test Results of Total Ionizing Dose Conducted at the Jet Propulsion LaboratoryThis paper reports recent Total Ionizing Dose (TID) test results obtained at JPL. Several device samples were analyzed exhibiting significant failure levels and ELDRS effects under biased and unbiased condition.
Document ID
20070019830
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Rivas, Rosa M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Johnston, Allan H.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Miyahira, Tetsuo F.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rax, Bernard G.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wiedeman, Michael D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 23, 2013
Publication Date
June 20, 2004
Subject Category
Fluid Mechanics And Thermodynamics
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Atlanta, GA
Country: United States
Start Date: June 20, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
Enhanced Low Dose Rate Sensitivity (ELDRS)
Complementary Metal Oxide Semiconductors (CMOS)
Bipolar
High Dose Level (HDL)
Low Dose Level (LDL)
Total Ionizing Dose (TID)

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