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Frequency Dependence of Single-event Upset in Advanced Commerical PowerPC MicroprocessorsThis paper examines single-event upsets in advanced commercial SOI microprocessors in a dynamic mode, studying SEU sensitivity of General Purpose Registers (GPRs) with clock frequency. Results are presented for SOI processors with feature sizes of 0.18 microns and two different core voltages. Single-event upset from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequency up to 1GHz. Frequency and core voltage dependence of single-event upsets in registers is discussed.
Document ID
20070023697
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/39993
Authors
Irom, Frokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Farmanesh, Farhad F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Swift, Gary M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Johnston, Allen H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 23, 2013
Publication Date
July 19, 2004
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Atlanta, GA
Country: United States
Start Date: June 19, 2004
End Date: June 20, 2004
Distribution Limits
Public
Copyright
Other
Keywords
single-event upset (SEU)
microprocessors
radiation testing

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