NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Crystal Growth and Characterization of CdTe Grown by Vertical Gradient FreezeIn this study, crystals of CdTe were grown from melts by the unseeded vertical gradient freeze method. The quality of grown crystal were studied by various characterization techniques including Synchrotron White Beam X-ray Topography (SWBXT), chemical analysis by glow discharge mass spectroscopy (GDMS), low temperature photoluminescence (PL), and Hall measurements. The SWBXT images from various angles show nearly strain-free grains, grains with inhomogeneous strains, as well as twinning nucleated in the shoulder region of the boule. The GDMS chemical analysis shows the contamination of Ga at a level of 3900 ppb, atomic. The low temperature PL measurement exhibits the characteristic emissions of a Ga-doped sample. The Hall measurements show a resistivity of 1 x l0(exp 7) ohm-cm at room temperature to 3 x 10(exp 9) ohm-cm at 78K with the respective hole and electron concentration of 1.7 x 10(exp 9) cm(exp -3) and 3.9 x 10(exp 7) cm(exp -3) at room temperature.
Document ID
20070032649
Acquisition Source
Marshall Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Su, Ching-Hua
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Lehoczky, S. L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Raghothamachar, B.
(State Univ. of New York Stony Brook, NY, United States)
Dudley, M.
(State Univ. of New York Stony Brook, NY, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2007
Subject Category
Solid-State Physics
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available