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Effects of Low Temperature on Charging of Spacecraft DielectricsSpacecraft dielectric charging, sometimes called deep-dielectric-charging or bulk-charging, occurs when high energy electrons imbed themselves in dielectric materials, and the charge density builds up, sometimes to breakdown levels. Charges usually bleed off slowly due to material conductivity. At very low (cryogenic) temperatures, the dielectric conductivity decreases until charges may remain and build up over weeks, months, or years. In those cases, the guidelines given in NASA and industry documents for when dielectric charging may become important are misleading. Arcing tests of spacecraft cables at liquid nitrogen temperatures and very low flux levels have been done at NASA MSFC for the JWST Project. In this paper, we describe the results of those tests and analyze their important implications for cryogenic spacecraft cable design and construction.
Document ID
20080013608
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Ferguson, Dale C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Schneider, Todd A.
Vaughn, Jason A.
Date Acquired
August 24, 2013
Publication Date
January 22, 2008
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 4th Space Environment Symposium
Location: Tokyo
Country: Japan
Start Date: January 22, 2008
End Date: January 23, 2008
Sponsors: Japan Aerospace Exploration Agency
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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