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Commercial Sensory Survey Radiation Testing Progress ReportThe NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07) and three sensors were selected for total ionizing dose (TID) and displacement damage dose (DDD) tolerance testing. The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. These criteria are discussed in detail in [1]. This document discusses the progress of radiation testing on the Micron and OmniVision sensors selected in FY07 for radiation tolerance testing.
Document ID
20080024220
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Becker, Heidi N.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dolphic, Michael D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Thorbourn, Dennis O.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Alexander, James W.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Salomon, Phil M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
April 1, 2008
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
JPL-Publ-08-22
Funding Number(s)
PROJECT: JPL Proj. 102197
WBS: WBS 939904.01.11.30
Distribution Limits
Public
Copyright
Other
Keywords
Micron
unbiased proton irradiation
radiation testing

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