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Metal Whiskers: Failure Modes and Mitigation StrategiesMetal coatings especially tin, zinc and cadmium are unpredictably susceptible to the formation of electrically conductive, crystalline filaments referred to as metal whiskers. The use of such coatings in and around electrical systems presents a risk of electrical shorting. Examples of metal whisker formation are shown with emphasis on optical inspection techniques to improve probability of detection. The failure modes (i.e., electrical shorting behavior) associated with metal whiskers are described. Based on an almost 9- year long study, the benefits of polyurethane conformal coat (namely, Arathane 5750) to protect electrical conductors from whisker-induced short circuit anomalies is discussed.
Document ID
20080030355
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Brusse, Jay A.
(Perot Systems Corp. Greenbelt, MD, United States)
Leidecker, Henning
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
December 4, 2007
Subject Category
Metals And Metallic Materials
Meeting Information
Meeting: Microelectronics Reliability and Qualification Workshop
Location: Manhattan Beach, CA
Country: United States
Start Date: December 4, 2007
End Date: December 5, 2007
Distribution Limits
Public
Copyright
Other

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