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Microdose Induced Data Loss on Floating Gate MemoriesHeavy ion irradiation of flash memories shows loss of stored data. The fluence dependence is indicative of microdose effects. Other qualitative factors identifying the effect as microdose are discussed. The data is presented, and compared to statistical results of a microdose target-based model.
Document ID
20090014087
Acquisition Source
Jet Propulsion Laboratory
Document Type
Reprint (Version printed in journal)
Authors
Guertin, Steven M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nguyen, Duc M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Patterson, Jeffrey D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
December 1, 2006
Publication Information
Publication: IEEE Transactions on Nuclear Science, Vol. 53, No. 6, December 2006
Publisher: Institute of Electrical and Electronics Engineers
Volume: 53
Issue: 6
ISSN: 0018-9499
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
radiation effects
losses
flash memories

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