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Impact of Device Scaling on Deep Sub-micron Transistor Reliability: A Study of Reliability Trends using SRAMAs microelectronics are scaled in to the deep sub-micron regime, users of advanced technology CMOS, particularly in high-reliability applications, should reassess how scaling effects impact long-term reliability. An experimental based reliability study of industrial grade SRAMs, consisting of three different technology nodes, is proposed to substantiate current acceleration models for temperature and voltage life-stress relationships. This reliability study utilizes step-stress techniques to evaluate memory technologies (0.25mum, 0.15mum, and 0.13mum) embedded in many of today's high-reliability space/aerospace applications. Two acceleration modeling approaches are presented to relate experimental FIT calculations to Mfr's qualification data.
Document ID
20090014093
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
White, Mark
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Huang, Bing
(Maryland Univ. College Park, MD, United States)
Qin, Jin
(Maryland Univ. College Park, MD, United States)
Gur, Zvi
(Maryland Univ. College Park, MD, United States)
Talmor, Michael
(Maryland Univ. College Park, MD, United States)
Chen, Yuan
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Heidecker, Jason
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nguyen, Duc
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Bernstein, Joseph
(Maryland Univ. College Park, MD, United States)
Date Acquired
August 24, 2013
Publication Date
October 17, 2005
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2005 IEEE International Integrated Reliability Workshop
Country: United States
Start Date: October 17, 2005
End Date: October 20, 2005
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
CMOS integrated circuits
SRAM chips
integrated circuit modelling
integrated circuit reliability
embedded systems

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