Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
White, Mark (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Huang, Bing (Maryland Univ. College Park, MD, United States) Qin, Jin (Maryland Univ. College Park, MD, United States) Gur, Zvi (Maryland Univ. College Park, MD, United States) Talmor, Michael (Maryland Univ. College Park, MD, United States) Chen, Yuan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Heidecker, Jason (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Nguyen, Duc (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Bernstein, Joseph (Maryland Univ. College Park, MD, United States) Date Acquired
August 24, 2013
Publication Date
October 17, 2005
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: 2005 IEEE International Integrated Reliability Workshop
Country: United States
Start Date: October 17, 2005
End Date: October 20, 2005
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
CMOS integrated circuitsSRAM chipsintegrated circuit modellingintegrated circuit reliabilityembedded systems