Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Chavez, Rosa M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Rax, Bernard G. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Scheick, Leif Z. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Johnston, Allan H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) FROM (NASA Headquarters Washington, DC United States) Date Acquired
August 24, 2013
Publication Date
July 11, 2005
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: Radiation Effects Data Workshop, 2005
Country: United States
Start Date: July 11, 2005
End Date: July 15, 2005
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
radiation effectsBiCMOS analogue integrated circuitsintegrated circuit testingbipolar analogue integrated circuits