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Towards a Framework for Evaluating and Comparing Diagnosis AlgorithmsDiagnostic inference involves the detection of anomalous system behavior and the identification of its cause, possibly down to a failed unit or to a parameter of a failed unit. Traditional approaches to solving this problem include expert/rule-based, model-based, and data-driven methods. Each approach (and various techniques within each approach) use different representations of the knowledge required to perform the diagnosis. The sensor data is expected to be combined with these internal representations to produce the diagnosis result. In spite of the availability of various diagnosis technologies, there have been only minimal efforts to develop a standardized software framework to run, evaluate, and compare different diagnosis technologies on the same system. This paper presents a framework that defines a standardized representation of the system knowledge, the sensor data, and the form of the diagnosis results and provides a run-time architecture that can execute diagnosis algorithms, send sensor data to the algorithms at appropriate time steps from a variety of sources (including the actual physical system), and collect resulting diagnoses. We also define a set of metrics that can be used to evaluate and compare the performance of the algorithms, and provide software to calculate the metrics.
Document ID
20100026829
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Kurtoglu, Tolga
(Mission Critical Technologies, Inc. Moffett Field, CA, United States)
Narasimhan, Sriram
(California Univ. Santa Cruz, CA, United States)
Poll, Scott
(NASA Langley Research Center Hampton, VA, United States)
Garcia,David
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) United States)
Kuhn, Lukas
(Palo Alto Research Center, Inc. Palo Alto, CA, United States)
deKleer, Johan
(Palo Alto Research Center, Inc. Palo Alto, CA, United States)
vanGemund, Arjan
(Delft Univ. of Technology Delft, Netherlands)
Feldman, Alexander
(Palo Alto Research Center, Inc. Palo Alto, CA, United States)
Date Acquired
August 24, 2013
Publication Date
June 14, 2009
Subject Category
Computer Systems
Report/Patent Number
ARC-E-DAA-TN607
Meeting Information
Meeting: 20th International Workshop on Principles of Diagnosis
Location: Stockholm
Country: Sweden
Start Date: June 14, 2009
End Date: June 17, 2009
Distribution Limits
Public
Copyright
Public Use Permitted.
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