NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Radiation Tests of Highly Scaled, High-Density, Commercial, Nonvolatile NAND Flash Memories - Update 2010High-density, commercial, nonvolatile flash memories with NAND architecture are now available from several manufacturers. This report examines SEE effects and TID response in single-level cell (SLC) and multi-level cell (MLC) NAND flash memories manufactured by Micron Technology.
Document ID
20100042140
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
Authors
Irom, Farokh
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nguyen, Duc N.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
October 1, 2010
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
JPL-Publ-10-16
Funding Number(s)
CONTRACT_GRANT: NAS7-03001
WBS: WBS 939904.01.11.30
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available