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Particle-in-Cell Simulation of Collisionless Driven Reconnection with Open BoundariesFirst results are discussed from an ongoing study of driven collisionless reconnection using a 2 1/2-dimensional electromagnetic particle-in-cell simulation model with open inflow and outflow boundaries. An extended electron diffusion region (EEDR) is defined as that region surrounding a reconnecting neutral line in which the out-of-plane nonideal electric field is positive. It is shown that the boundaries of this region in the directions of the outflow jets are at the positions where the electrons make the transition from unfrozen meandering motion in the current sheet to outward drifting with the magnetic field in the outflow jets; a turning length scale is defined to mark these positions, The initial width of the EEDR in the inflow directions is comparable to the electron bounce width. Later. as shoulders develop to form a two-scale structure. thc EEDR width expands to the ion bounce width scale. The inner portion of the EEDR or the electron diffusion region proper remains at the electron bounce width. Two methods are introduced for predicting the reconnection electric field using the dimensions of the EEDR. These results are interpreted as further evidence that the EEDR is the region that is relevant to understanding the electron role in the neutral line vicinity.
Document ID
20110010996
Acquisition Source
Goddard Space Flight Center
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Kimas, Alex
(Maryland Univ. Greenbelt, MD, United States)
Hesse, Michael
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Zenitani, Seiji
(Maryland Univ. Greenbelt, MD, United States)
Kuznetsova, Maria
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 25, 2013
Publication Date
November 11, 2010
Publication Information
Publication: Physics of Plasmas
Publisher: American Inst. of Physics
Volume: 17
ISSN: 1070-664X
Subject Category
Plasma Physics
Distribution Limits
Public
Copyright
Other

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