Acquisition Source
Jet Propulsion Laboratory
Authors
Scheick, Leif (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 25, 2013
Publication Date
September 1, 2011
Subject Category
Electronics And Electrical Engineering Distribution Limits
Public
Keywords
Single Event Gate RupturePower MOSFETsSingle Event Burnout,