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Electronic Health ManagementAccelerated aging methodologies for electrolytic components have been designed and accelerated aging experiments have been carried out. The methodology is based on imposing electrical and/or thermal overstresses via electrical power cycling in order to mimic the real world operation behavior. Data are collected in-situ and offline in order to periodically characterize the devices' electrical performance as it ages. The data generated through these experiments are meant to provide capability for the validation of prognostic algorithms (both model-based and data-driven). Furthermore, the data allow validation of physics-based and empirical based degradation models for this type of capacitor. A first set of models and algorithms has been designed and tested on the data.
Document ID
20110023702
Acquisition Source
Ames Research Center
Document Type
Presentation
Authors
Celaya, Jose R.
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States)
Saha, Sankalita
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States)
Goebel, Kai
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 25, 2013
Publication Date
May 10, 2011
Subject Category
Avionics And Aircraft Instrumentation
Report/Patent Number
ARC-E-DAA-TN3497
Meeting Information
Meeting: NASA Aviation Safety Program Annual Technical Meeting
Location: St. Louis, MO
Country: United States
Start Date: May 10, 2011
End Date: May 12, 2011
Sponsors: NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNA08CG83C
Distribution Limits
Public
Copyright
Public Use Permitted.
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