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Radiation Tests of Highly scaled, High-Density, Commercial, Nonvolatile NAND Flash Memories--Update 2011High-density, commercial, nonvolatile flash memories with NAND architecture are now available from several manufacturers. This report examines SEE effects and TID response in single-level cell (SLC) 32Gb and multi-level cell (MLC) 64Gb NAND flash memories manufactured by Micron Technology.
Document ID
20120001660
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/41945
Authors
Irom, Farokh
Nguyen, Duc N.
Date Acquired
August 25, 2013
Publication Date
October 1, 2011
Report/Patent Number
JPL-Publ-11-8
Distribution Limits
Public
Copyright
Other
Keywords
Heavy ion
Flash memory
Single event

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