Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Johnston, Allan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 25, 2013
Publication Date
April 10, 2011
Subject Category
Spacecraft Design, Testing And Performance Meeting Information
Meeting: IEEE International Reliability Physics Symposium
Location: Monterey, CA
Country: United States
Start Date: April 10, 2011
End Date: April 14, 2011
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
semiconductor devicesreliabilitycompoenentsradiation effects