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A Compact, Fast, Wide-Field Imaging Spectrometer SystemWe present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33 degree field of view, operating in the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography techniques. High degree of spectral and spatial uniformity (97%) is achieved.
Document ID
20120009871
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/42076
Authors
Mouroulis, Pantazis (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
VanGorp, Byron E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
White, Victor E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mumolo, Jason M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Hebert, Daniel (Louisiana State Univ. Baton Rouge, LA, United States)
Feldman, Martin (Louisiana State Univ. Baton Rouge, LA, United States)
Date Acquired
August 25, 2013
Publication Date
April 26, 2011
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: SPIE Next-Generation Spectroscopic Technologies IV
Location: Orlando, FL
Country: United States
Start Date: April 25, 2011
End Date: April 26, 2011
Distribution Limits
Public
Copyright
Other
Keywords
diffraction grating
x-ray lithogrpahy
imaging spectrometry
Dyson spectrometer

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