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Measuring X-Ray Polarization in the Presence of Systematic EffectsWe describe a mathematical formalism for determining the 1 and 2 parameter errors in the magnitude and position angle of X ]ray polarization. The formalism includes a treatment of systematic effects, such as background and instrumental bias.
Document ID
20120015356
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Elsner, R. F. (NASA Marshall Space Flight Center Huntsville, AL, United States)
ODell, S. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Weisskopf, M. C. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 26, 2013
Publication Date
July 1, 2012
Publication Information
Publication: Proceedings of SPIE
Volume: 8443
Subject Category
Astronomy
Report/Patent Number
M12-1929
Meeting Information
Meeting: Space Telescope and Instrumentation 2012: Ultraviolet to Gamma Ray
Location: Amsterdam
Country: Netherlands
Start Date: July 1, 2012
End Date: July 6, 2012
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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