NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Objective Characterization of Snow Microstructure for Microwave Emission ModelingPassive microwave (PM) measurements are sensitive to the presence and quantity of snow, a fact that has long been used to monitor snowcover from space. In order to estimate total snow water equivalent (SWE) within PM footprints (on the order of approx 100 sq km), it is prerequisite to understand snow microwave emission at the point scale and how microwave radiation integrates spatially; the former is the topic of this paper. Snow microstructure is one of the fundamental controls on the propagation of microwave radiation through snow. Our goal in this study is to evaluate the prospects for driving the Microwave Emission Model of Layered Snowpacks with objective measurements of snow specific surface area to reproduce measured brightness temperatures when forced with objective measurements of snow specific surface area (S). This eliminates the need to treat the grain size as a free-fit parameter.
Document ID
20120015412
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Durand, Michael
(Ohio State Univ. Columbus, OH, United States)
Kim, Edward J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Molotch, Noah P.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Margulis, Steven A.
(California Univ. Los Angeles, CA, United States)
Courville, Zoe
(Corps of Engineers Hanover, NH, United States)
Malzler, Christian
(Bern Univ. Bern, Switzerland)
Date Acquired
August 26, 2013
Publication Date
July 23, 2012
Subject Category
Meteorology And Climatology
Report/Patent Number
GSFC.CPR.7022.2012
Meeting Information
Meeting: IEEE 2012 Geoscience and Remote Sensing Symposium
Location: Munich
Country: Germany
Start Date: July 23, 2012
End Date: July 27, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
No Preview Available