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Minority Carrier Lifetime and Photoluminescence Studies of Antimony-Based SuperlatticesIn this paper, we have used the OMR technique to study the minority carrier lifetimes in three InAs/GaSb-photoluminescence (PL) structures with different number of periods in the absorber: 300, 400 and 600 periods respectively. The feasibility of using a visible 643 nm laser source with short penetration depth for lifetime measurements was studied by comparing the achieved results to measurements performed on the same samples with a 1550 nm IR laser source, which penetrates much deeper into the sample. Despite the differences in excitation wavelengths and penetration depths, the results from both measurements were very similar. This indicates that the diffusion length is long enough to facilitate a homogeneous distribution of excess carriers in the material.
Document ID
20130000253
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Hoglund, Linda
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Soibel, Alexander
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ting, David Z.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Khoshakhlagh, Arezou
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Hill, Cory J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Gunapala, Sarath D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
August 13, 2012
Subject Category
Optics
Meeting Information
Meeting: SPIE Optics and Photonics 2012
Location: San Diego, CA
Country: United States
Start Date: August 12, 2012
End Date: August 16, 2012
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
photodetector
minority carrier lifetime
superlattice
photoluminescence
infrared

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