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Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions
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Author and Affiliation:
Kulkarni, Chetan S.(Vanderbilt Univ., Nashville, TN, United States);
Celaya, Jose R.(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.), Moffett Field, CA, United States);
Goebel, Kai(NASA Ames Research Center, Moffett Field, CA, United States);
Biswas, Gautam(Vanderbilt Univ., Nashville, TN, United States)
Abstract: Electrolytic capacitors are used in several applications ranging from power supplies for safety critical avionics equipment to power drivers for electro-mechanical actuator. Past experiences show that capacitors tend to degrade and fail faster when subjected to high electrical or thermal stress conditions during operations. This makes them good candidates for prognostics and health management. Model-based prognostics captures system knowledge in the form of physics-based models of components in order to obtain accurate predictions of end of life based on their current state of heal th and their anticipated future use and operational conditions. The focus of this paper is on deriving first principles degradation models for thermal stress conditions and implementing Bayesian framework for making remaining useful life predictions. Data collected from simultaneous experiments are used to validate the models. Our overall goal is to derive accurate models of capacitor degradation, and use them to remaining useful life in DC-DC converters.
Publication Date: Sep 23, 2012
Document ID:
20130001673
(Acquired Jan 15, 2013)
Subject Category: ELECTRONICS AND ELECTRICAL ENGINEERING
Report/Patent Number: ARC-E-DAA-TN5953
Document Type: Conference Paper
Meeting Information: Annual Conference of the PHM Society 2012; 23-27 Sep. 2012; Minneapolis, MN; United States
Contract/Grant/Task Num: NNA08CG83C
Financial Sponsor: NASA Ames Research Center; Moffett Field, CA, United States
Organization Source: NASA Ames Research Center; Moffett Field, CA, United States
Description: 11p; In English; Original contains color and black and white illustrations
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright; Distribution as joint owner in the copyright
NASA Terms: BAYES THEOREM; CAPACITORS; ELECTROLYTES; MODELS; LIFE (DURABILITY); DYNAMIC MODELS; MATHEMATICAL MODELS; DEGRADATION; AVIONICS; ELECTROCHEMISTRY; SYSTEMS HEALTH MONITORING; FAILURE; ELECTROLYTIC CELLS; KALMAN FILTERS
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