Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Allen, Gregory R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Scheick, Leif Z. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Zajac, Stephanie (State Univ. of New York Stony Brook, NY, United States) Date Acquired
August 27, 2013
Publication Date
July 16, 2012
Subject Category
Spacecraft Design, Testing And Performance Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Distribution Limits
Public
Keywords
reliabilitysingle event functional interrupt (SEFI)Single Event Effects (SEE)microelectronic technologies