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Reliability Considerations for Ultra- Low Power Space ApplicationsNASA, the aerospace community, and other high reliability (hi-rel) users of advanced microelectronic products face many challenges as technology continues to scale into the deep sub- micron region and ULP devices are sought after. Technology trends, ULP microelectronics, scaling and performance tradeoffs, reliability considerations, and spacecraft environments will be presented from a ULP perspective for space applications.
Document ID
20130010583
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/42707
Authors
White, Mark (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Johnston, Allan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 27, 2013
Publication Date
April 15, 2012
Subject Category
Spacecraft Propulsion And Power
Meeting Information
Meeting: IEEE International Reliability Physics Symposium (IRPS 2012)
Location: Anaheim, CA
Country: United States
Start Date: April 15, 2012
End Date: April 19, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
reliability
microelectronics
ultra-low power (ULP)

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