Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
Authors
White, Mark (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
August 27, 2013
Publication Date
April 18, 2012
Subject Category
Spacecraft Design, Testing And Performance Meeting Information
Meeting: 2012 IEEE International Reliability Physics Symposium (IRPS 2012)
Location: Anaheim, CA
Country: United States
Start Date: April 15, 2012
End Date: April 19, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
Scaled CMOSreliabilityscalingsystem reliability