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Commercial Parts Technology Qualification Processes
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External Online Source: hdl:2014/43231
Author and Affiliation:
Cooper, Mark S.(Jet Propulsion Lab., California Inst. of Tech., Pasadena, CA, United States)
Abstract: Many high-reliability systems, including space systems, use selected commercial parts (including Plastic Encapsulated Microelectronics or PEMs) for unique functionality, small size, low weight, high mechanical shock resistance, and other factors. Predominantly this usage is subjected to certain 100% tests (typically called screens) and certain destructive tests usually (but not always) performed on the flight lot (typically called qualification tests). Frequently used approaches include those documented in EEE-INST-002 and JPL DocID62212 (which are sometimes modified by the particular aerospace space systems manufacturer). In this study, approaches from these documents and several space systems manufacturers are compared to approaches from a launch systems manufacturer (SpaceX), an implantable medical electronics manufacturer (Medtronics), and a high-reliability transport system process (automotive systems). In the conclusions section, these processes are outlined for all of these cases and presented in tabular form. Then some simple comparisons are made. In this introduction section, the PEM technology qualification process is described, as documented in EEE-INST-002 (written by the Goddard Space Flight Center, GSFC), as well as the somewhat modified approach employed at the Jet Propulsion Laboratory (JPL). Approaches used at several major NASA contractors are also described
Publication Date: Mar 01, 2013
Document ID:
20130013988
(Acquired Jul 19, 2013)
Subject Category: QUALITY ASSURANCE AND RELIABILITY
Report/Patent Number: JPL-Publ-13-6
Document Type: Technical Report
Contract/Grant/Task Num: NAS7-03001
Financial Sponsor: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Organization Source: Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Description: 53p; In English; Original contains color and black and white illustrations
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright; Distribution under U.S. Government purpose rights; under NASA contract NAS7-03001
NASA Terms: DESTRUCTIVE TESTS; RELIABILITY; PERFORMANCE TESTS; MEDICAL ELECTRONICS; AEROSPACE SYSTEMS; MICROELECTRONICS; CONTRACTORS; LOW WEIGHT; MECHANICAL SHOCK
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