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An Analysis of Heavy-Ion Single Event Effects for a Variety of Finite State-Machine Mitigation StrategiesFinite state-machines (FSMs) are used to control operational flow in application specific integrated circuits (ASICs) and field programmable gate array (FPGA) devices. Because of their ease of interpretation, FSMs simplify the design and verification process and consequently are significant components in a synchronous design.
Document ID
20140008975
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie D. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Kim, Hak (ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, Anthony (ASRC Federal Space and Defense Greenbelt, MD, United States)
Seidleck, Christina (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
July 10, 2014
Publication Date
May 19, 2014
Subject Category
Electronics And Electrical Engineering
Space Radiation
Report/Patent Number
GSFC-E-DAA-TN14583
2014-561-NEPP
GSFC-E-DAA-TN36684
Meeting Information
Meeting: Single Event Effects (SEE) Symposium and the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop
Location: La Jolla, CA
Country: United States
Start Date: May 19, 2014
End Date: May 22, 2014
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Field Programmable Gate Array (FPGA)
Single Event Upset (SEU) Testing
Finite State Machine (FSM)
Mitigation

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