NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Single Event Rates for Devices Sensitive to Particle EnergySingle event rates (SER) can include contributions from low-energy particles such that the linear energy transfer (LET) is not constant. Previous work found that the environmental description that is most relevant to the low-energy contribution to the rate is a "stopping rate per unit volume" even when the physical mechanisms for a single-event effect do not require an ion to stop in some device region. Stopping rate tables are presented for four heavy-ion environments that are commonly used to assess device suitability for space applications. A conservative rate estimate utilizing limited test data is derived, and the example of SEGR rate in a power MOSFET is presented.
Document ID
20150005509
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Edmonds, L. D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Scheick, L. Z.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Banker, M. W.
(Florida Univ. Gainesville, FL, United States)
Date Acquired
April 10, 2015
Publication Date
July 16, 2012
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2012)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
conservative rate
design case devices
linear energy transfer
particle energy
single-event gate rupture (SEGR)

Available Downloads

There are no available downloads for this record.
No Preview Available