Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Pease, Ronald L. (RLP Research, Inc. Albuquerque, NM, United States) Adell, Philippe C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Rax, Bernard (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) McClure, Steven (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Barnaby, Hugh J. (Arizona State Univ. Tempe, AZ, United States) Kruckmeyer, Kirby (National Semiconductor Corp. Santa Clara, CA, United States) Triggs, B. (SEMICOA Corp. Costa Mesa, CA, United States) Date Acquired
April 29, 2015
Publication Date
July 25, 2011
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: 2011 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2011)
Location: Las Vegas, NV
Country: United States
Start Date: July 25, 2011
End Date: July 29, 2011
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
radiation effectshydrogentotal ionizing dosedose rateenhanced low-dose rate sensitivity (ELDRS)bipolar linear circuits