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Evaluation of an Accelerated ELDRS Test Using Molecular HydrogenAn accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative.
Document ID
20150006909
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Pease, Ronald L.
(RLP Research, Inc. Albuquerque, NM, United States)
Adell, Philippe C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rax, Bernard
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
McClure, Steven
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Barnaby, Hugh J.
(Arizona State Univ. Tempe, AZ, United States)
Kruckmeyer, Kirby
(National Semiconductor Corp. Santa Clara, CA, United States)
Triggs, B.
(SEMICOA Corp. Costa Mesa, CA, United States)
Date Acquired
April 29, 2015
Publication Date
July 25, 2011
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2011 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2011)
Location: Las Vegas, NV
Country: United States
Start Date: July 25, 2011
End Date: July 29, 2011
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
radiation effects
hydrogen
total ionizing dose
dose rate
enhanced low-dose rate sensitivity (ELDRS)
bipolar linear circuits

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