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FE Simulation of SMA Seal for Mars Sample ReturnSeveral NASA rovers and landers have been on Mars and performed successful in-situ exploration. Returning Martian samples to Earth for extensive analysis is of great interest to the planetary science community. Current Mars sample return architecture would require leaving the acquired samples on Mars for years before being retrieved by subsequent mission. Each sample would be sealed securely to keep its integrity. A reliable seal technique that does not affect the integrity of the samples and uses a simple low-mass tool is required. The shape memory alloy (SMA) seal technique is a promising candidate. A study of the thermal performances of several primary designs of a SMA seal for sample tubes by finite element (FE) simulation are presented in this paper. The results show sealing the sample tube by SMA plugs and controlling the sample temperature below the allowed temperature level are feasible.
Document ID
20150007416
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Bao, Xiaoqi
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Younse, Paulo
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Bhandari, Pradeep
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 6, 2015
Publication Date
March 10, 2013
Subject Category
Lunar And Planetary Science And Exploration
Quality Assurance And Reliability
Meeting Information
Meeting: SPIE Smart Structures/NDE Conference and Exhibition
Location: San Diego, CA
Country: United States
Start Date: March 10, 2013
End Date: March 14, 2013
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
seal
shape memory alloy (SMA)
Mars sample retrun
finite element (FE) simulation

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