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Characterization and Absolute QE Measurements of Delta-Doped N-Channel and P-Channel CCDsIn this paper we present the methodology for making absolute quantum efficiency (QE) measurements from the vacuum ultraviolet (VUV) through the near infrared (NIR) on delta-doped silicon CCDs. Delta-doped detectors provide an excellent platform to validate measurements through the VUV due to their enhanced UV response. The requirements for measuring QE through the VUV are more strenuous than measurements in the near UV and necessitate, among other things, the use of a vacuum monochromator, and good camera vacuum to prevent chip condensation, and more stringent handling requirements. The system used for these measurements was originally designed for deep UV characterization of CCDs for the WF/PC instrument on Hubble and later for Cassini CCDs.
Document ID
20150008520
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Jacquot, Blake C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Monacos, Steve P.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Jones, Todd J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Blacksberg, Jordana
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Hoenk, Michael E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nikzad, Shouleh
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 20, 2015
Publication Date
June 27, 2010
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: SPIE Astronomical Telescopes and Instrumentation 2010 Conference
Location: San Diego, CA
Country: United States
Start Date: June 27, 2010
End Date: July 2, 2010
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other

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