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Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion LaboratoryThis paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Document ID
20150008624
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/44841
Authors
Miyahira, Tetsuo F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 20, 2015
Publication Date
July 14, 2008
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2008 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2008)
Location: Tucson, AZ
Country: United States
Start Date: July 14, 2008
End Date: July 18, 2008
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other

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