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Reliability and Qualification of Hardware to Enhance the Mission Assurance of JPL/NASA ProjectsPackaging Qualification and Verification (PQV) and life testing of advanced electronic packaging, mechanical assemblies (motors/actuators), and interconnect technologies (flip-chip), platinum temperature thermometer attachment processes, and various other types of hardware for Mars Exploration Rover (MER)/Mars Science Laboratory (MSL), and JUNO flight projects was performed to enhance the mission assurance. The qualification of hardware under extreme cold to hot temperatures was performed with reference to various project requirements. The flight like packages, assemblies, test coupons, and subassemblies were selected for the study to survive three times the total number of expected temperature cycles resulting from all environmental and operational exposures occurring over the life of the flight hardware including all relevant manufacturing, ground operations, and mission phases. Qualification/life testing was performed by subjecting flight-like qualification hardware to the environmental temperature extremes and assessing any structural failures, mechanical failures or degradation in electrical performance due to either overstress or thermal cycle fatigue. Experimental flight qualification test results will be described in this presentation.
Document ID
20150008906
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Ramesham, Rajeshuni
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 26, 2015
Publication Date
July 11, 2010
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: International Conference on Environmental Systems
Location: Barcelona
Country: Spain
Start Date: July 11, 2010
End Date: July 15, 2010
Sponsors: Society of Automotive Engineers, Inc., American Inst. of Aeronautics and Astronautics, American Society of Mechanical Engineers, American Inst. of Chemical Engineers
Distribution Limits
Public
Copyright
Other
Keywords
PRTs
bonding failures
heaters
leadless chip carrier failures
solder joint failures
flip-chip failures
life testing
Extreme temperatures
sensors

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