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6H-SiC Transistor Integrated Circuits Demonstrating Prolonged Operation at 500 CThe NASA Glenn Research Center is developing very high temperature semiconductor integrated circuits (ICs) for use in the hot sections of aircraft engines and for Venus exploration where ambient temperatures are well above the approximately 300 degrees Centigrade effective limit of silicon-on-insulator IC technology. In order for beneficial technology insertion to occur, such transistor ICs must be capable of prolonged operation in such harsh environments. This paper reports on the fabrication and long-term 500 degrees Centigrade operation of 6H-SiC integrated circuits based on epitaxial 6H-SiC junction field effect transistors (JFETs). Simple analog amplifier and digital logic gate ICs have now demonstrated thousands of hours of continuous 500 degrees Centigrade operation in oxidizing air atmosphere with minimal changes in relevant electrical parameters. Electrical characterization and modeling of transistors and circuits at temperatures from 24 degrees Centigrade to 500 degrees Centigrade is also described. Desired analog and digital IC functionality spanning this temperature range was demonstrated without changing the input signals or power supply voltages.
Document ID
20150022226
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
External Source(s)
Authors
Neudeck, Philip G.
(NASA Glenn Research Center Cleveland, OH, United States)
Spry, David J.
(NASA Glenn Research Center Cleveland, OH, United States)
Chen, Liang-Yu
(Ohio Aerospace Inst. Cleveland, OH, United States)
Chang, Carl W.
(ASRC Aerospace Corp. Cleveland, OH, United States)
Beheim, Glenn M.
(NASA Glenn Research Center Cleveland, OH, United States)
Okojie, Robert S.
(NASA Glenn Research Center Cleveland, OH, United States)
Evans, Laura J.
(NASA Glenn Research Center Cleveland, OH, United States)
Meredith, Roger
(NASA Glenn Research Center Cleveland, OH, United States)
Ferrier, Terry
(NASA Glenn Research Center Cleveland, OH, United States)
Krasowski, Michael J.
(NASA Glenn Research Center Cleveland, OH, United States)
Prokop, Norman F.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
December 3, 2015
Publication Date
May 13, 2008
Subject Category
Solid-State Physics
Electronics And Electrical Engineering
Report/Patent Number
GRC-WO-667828
Meeting Information
Meeting: International Conference on High Temperature Electronics (HiTEC 2008)
Location: Albuquerque, NM
Country: United States
Start Date: May 13, 2008
End Date: May 15, 2008
Sponsors: International Microelectronics and Packaging Society
Funding Number(s)
WBS: WBS 122711.03.11.03.04.03.02
Distribution Limits
Public
Copyright
Public Use Permitted.
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