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Materials Outgassing Rate Decay in Vacuum at Isothermal ConditionsAs a laboratory for scientific research, the International Space Station has been in Low Earth Orbit for nearly 20 years and is expected to be on-orbit for another 10 years. The ISS has been maintaining a relatively pristine contamination environment for science payloads. Materials outgassing induced contamination is currently the dominant source for sensitive surfaces on ISS and modeling the outgassing rate decay over a 20 to 30 year period is challenging. Materials outgassing is described herein as a diffusion-reaction process using ASTM E 1559 rate data. The observation of -1/2 (diffusion) or non-integers (reaction limited) as rate decay exponents for common ISS materials indicate classical reaction kinetics is unsatisfactory in modeling materials outgassing. Non-randomness of reactant concentrations at the interface is the source of this deviation from classical reaction kinetics. A diffusion limited decay was adopted as the result of the correlation of the contaminant layer thicknesses on returned ISS hardware, the existence of high outgassing silicone exhibiting near diffusion limited decay, and the confirmation of non-depleted material after ten years in the Low Earth Orbit.Keywords: Materials Outgassing, ASTM E 1559, Reaction Kinetics, Diffusion, Space Environments Effects, Contamination
Document ID
20160007864
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Huang, Alvin Y.
(Boeing Co. Houston, TX, United States)
Kastanas, George N.
(Boeing Co. Houston, TX, United States)
Kramer, Leonard
(Boeing Co. Houston, TX, United States)
Soares, Carlos E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Mikatarian, Ronald R.
(Boeing Co. Houston, TX, United States)
Date Acquired
June 23, 2016
Publication Date
August 28, 2016
Subject Category
Chemistry And Materials (General)
Report/Patent Number
JSC-CN-36552
Meeting Information
Meeting: SPIE 2016
Location: San Diego, CA
Country: United States
Start Date: August 30, 2016
End Date: September 1, 2016
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Public Use Permitted.
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