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NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary DataWe present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).
Document ID
20160009477
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Other
Authors
Berg, Melanie D. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
July 28, 2016
Publication Date
June 13, 2016
Publication Information
Publication: NASA Electronic Parts and Packaging (NEPP) Program
Subject Category
Quality Assurance And Reliability
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN33313
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Field Programmable Gate Array (FPGA)
heavy ion
Hot and Cold Sparing
Microsemi RTG4
; Error Correction and Detection (EDAC)
Safe-State Machines
single event transients (SETs)
single event upsets (SEUs)

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