{"copyright":{"thirdPartyPermissionsProduced":false,"disclosedToPublic":false,"patent":"US-Patent-10,025,925","containsIndication":false,"publisherPermissionOrRightsToDistribute":false,"belongsToUsGov":false,"determinationType":"GOV_PUBLIC_USE_PERMITTED","thirdPartyContentCondition":"NOT_SET","belongsToContractor":false,"disclosedInvention":false,"submissionId":20180004375,"containsThirdPartyMaterial":false,"patentApplication":"US-Patent-Appl-SN-14/747,322","belongsToPublisher":false,"id":"fe65fcebc5724e2a99f565c1f8a61fea","belongsToAuthors":false},"subjectCategories":["Electronics And Electrical Engineering"],"exportControl":{"isExportControl":"NO","submissionId":20180004375,"ear":"NO","id":"807d1db5b2604c3cb6046c5d8f03ff00","itar":"NO"},"distributionDate":"2019-08-24T11:13:31.8000000+00:00","otherReportNumbers":["Patent Number: US-Patent-10,025,925","Patent Application Number: US-Patent-Appl-SN-14/747,322"],"fundingNumbers":[{"number":"FAS750-10-D-0197","submissionId":20180004375,"id":"7351359bced84d4abbde30646f0c0f1c","type":"CONTRACT_GRANT"},{"number":"W31P4QI3C0I43","submissionId":20180004375,"id":"2cb5cc92b09748c4a0522d9e1d418efb","type":"CONTRACT_GRANT"},{"number":"NNX15CL71P","submissionId":20180004375,"id":"f78fa64c5be64418a06d318c2753c157","type":"CONTRACT_GRANT"}],"title":"Dynamically Measuring the Integrity of a Computing Apparatus","stiType":"OTHER","distribution":"PUBLIC","submittedDate":"2018-08-10T11:55:25.3230000+00:00","authorAffiliations":[{"sequence":0,"submissionId":20180004375,"meta":{"author":{"name":"Carpenter, Todd P."},"organization":{}},"id":"6cd7f2cedbd3417f9f5bd7b29e39ce1c"},{"sequence":1,"submissionId":20180004375,"meta":{"author":{"name":"Johnston, Steven J."},"organization":{}},"id":"fc92f1c995ec4c5da59305e5dabb5da7"},{"sequence":2,"submissionId":20180004375,"meta":{"author":{"name":"De Silva, Ian J."},"organization":{}},"id":"abbab8d52f824f56a3ddc9e4e7ec8667"}],"stiTypeDetails":"Other - Patent","technicalReviewType":"TECHNICAL_REVIEW_TYPE_NONE","modified":"2025-08-31T18:39:21.7150190+00:00","id":20180004375,"legacyMeta":{"__type":"LegacyMetaIndex, StrivesApi.ServiceModel","accessionNumber":""},"created":"2018-08-10T11:55:25.3230000+00:00","center":{"code":"HQ","name":"Headquarters","id":"f0865a34ba1f474d865ab51f212fc69f"},"onlyAbstract":false,"sensitiveInformation":2,"abstract":"The present disclosure includes methods and systems for measuring the integrity of a device. A number of embodiments can include initiating an observatory in a system and initiating a remote manager. A number of embodiments can also include measuring the integrity of the device from the observatory and accessing the integrity measurement of the device from the remote manager.","isLessonsLearned":false,"disseminated":"DOCUMENT_AND_METADATA","publications":[{"submissionId":20180004375,"id":"67fe2389bed445e48caddbb1667b8e19","publicationDate":"2018-07-17T00:00:00.0000000+00:00"}],"status":"CURATED","related":[],"downloads":[{"draft":false,"mimetype":"application/pdf","name":"20180004375.pdf","type":"STI","links":{"original":"/api/citations/20180004375/downloads/20180004375.pdf","pdf":"/api/citations/20180004375/downloads/20180004375.pdf","fulltext":"/api/citations/20180004375/downloads/20180004375.txt"}}],"downloadsAvailable":true,"index":"submissions-2026-04-16-04-50"}