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Breakdown conduction in thin films of SiO, MgF2, CaF2, CeF3, CeO2 and Teflon Final reportBreakdown conduction in thin film dielectrics of silicon oxide, magnesium fluoride, calcium fluoride, cesium oxides, cesium fluorides, and Teflon
Document ID
19680007831
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Budenstein, P. P. (Auburn Univ. AL, United States)
Date Acquired
August 4, 2013
Publication Date
February 1, 1968
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-93153
Report Number: NASA-CR-93153
Accession Number
68N17300
Funding Number(s)
CONTRACT_GRANT: NGR-01-003-011
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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