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Design study of a Fourier spectrometer ellipsoidal mirror reflectometer system Final reportOptimization of interferometer and ellipsoidal reflectometer to measure reflectance of opaque materials
Document ID
19680020489
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kneissl, G. J. (Dunn Associates, Inc. Silver Spring, MD, United States)
Date Acquired
August 4, 2013
Publication Date
June 10, 1968
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-73234
Report Number: NASA-CR-73234
Accession Number
68N29961
Funding Number(s)
CONTRACT_GRANT: NAS2-4232
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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