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Experimental strain analysis technique for large deformations based on the optical properties of a thin metallic film deposited on a structural substrateExperimental strain analysis technique for large deformations based on optical properties of thin metallic film deposited on structural substrate
Document ID
19700021537
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Williams, J. G. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 2, 2013
Publication Date
May 1, 1970
Subject Category
Structural Mechanics
Report/Patent Number
NASA-TM-X-62991
Report Number: NASA-TM-X-62991
Accession Number
70N30848
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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