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Absolute capacitance microcreep and dimensional stability measuring systemAbsolute capacitance microcreep and dimensional stability measuring system
Document ID
19710026054
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Lyons, J. W., Jr. (NASA Electronics Research Center Cambridge, MA, United States)
Date Acquired
September 2, 2013
Publication Date
September 1, 1971
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-2046
Report Number: NASA-TM-X-2046
Accession Number
71N35530
Funding Number(s)
PROJECT: RTOP 129-03-42-04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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