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The applications of remote sensing to corn blight detection and crop yield forecastingPhotography revealed the widespread and variable effects of southern corn leaf blight in Indiana. Three levels of severity of the infection could be discerned from good quality color and color infrared photography. As many as five severity levels appeared to be detectable and classifiable with multispectral scanner data and pattern recognition analysis. These conclusions are preliminary in nature, however, having been obtained from a limited amount of good quality scanner data collected over a small geographic area.
Document ID
19720004629
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Macdonald, R. B.
(Purdue Univ. West Lafayette, IN, United States)
Date Acquired
August 6, 2013
Publication Date
January 1, 1970
Publication Information
Publication: NASA. Manned Spacecraft Center 3d Ann. Earth Resources Program Rev., Vol. 2
Subject Category
Geophysics
Accession Number
72N12278
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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