NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Measured current drainage through holes in various dielectrics up to 2 kilovolts in a dilute plasmaThe electron current drained from a plasma through approximately 0.05 cm diameter holes in eight possible space applicable dielectrics placed on a probe biased at voltages up to 2000 V dc have been determined both theoretically and experimentally. The dielectrics tested were Parylene C and N, Teflon FEP type C, Teflon TFE, Nomex, quartz 7940 Corning Glass, Mylar A, and Kapton H polymide film. A Laplace field was used to predict an upper limit for the drainage current. The measured current was less than the computed current for quartz, Teflon FEP, and the 0.0123 cm thick sample of Parylene N for all voltages tested. The drainage current through the other dielectrics became equal to or greater than the computed current at a voltage below 2000 V. The magnitudes of the currents were between 0.1 and 10 microamperes for most of the dielectrics.
Document ID
19720010137
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Technical Note (TN)
Authors
Grier, N. T.
(NASA Lewis Research Center Cleveland, OH, United States)
Mckinzie, D. J., Jr.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
February 1, 1972
Subject Category
Physics, Plasma
Report/Patent Number
NASA-TN-D-6663
E-6668
Report Number: NASA-TN-D-6663
Report Number: E-6668
Accession Number
72N17787
Funding Number(s)
PROJECT: RTOP 113-33
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available